Application of genetic algorithms to pattern recognition of defects in GIS

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 7, Issue 2, 2000, Pages 161-168

  Ziomek, W ^a,b   Reformat, M ^a   Kuffel, E ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC INSULATORS; ELECTRIC LINES; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; GENETIC ALGORITHMS; PARTIAL DISCHARGES; PATTERN RECOGNITION;

FLOATING ELECTRODES; GAS INSULATED SYSTEMS; PHASE RESOLVED PARTIAL DISCHARGE;

GAS FILLED CABLES;

EID: 0033741077     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.841804     Document Type: Article

References (17)

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