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Volumn 11, Issue 2, 2000, Pages 163-167

New approach to the determination of optical constants and thickness of thin dielectric transparent films

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; DEPOSITION; DIELECTRIC FILMS; EVAPORATION; LIGHT TRANSMISSION; OPTICAL GLASS; SUBSTRATES; THIN FILMS; TRANSPARENCY; VACUUM;

EID: 0033740710     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008937700655     Document Type: Article
Times cited : (14)

References (8)
  • 7
    • 0342860840 scopus 로고
    • Master Thesis, Université de Sétif, Algeria
    • K. AYADI, Master Thesis, Université de Sétif, Algeria (1987).
    • (1987)
    • Ayadi, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.