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Volumn 11, Issue 2, 2000, Pages 163-167
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New approach to the determination of optical constants and thickness of thin dielectric transparent films
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTATIONAL METHODS;
DEPOSITION;
DIELECTRIC FILMS;
EVAPORATION;
LIGHT TRANSMISSION;
OPTICAL GLASS;
SUBSTRATES;
THIN FILMS;
TRANSPARENCY;
VACUUM;
OPTICAL CONSTANTS;
OPTICAL FILMS;
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EID: 0033740710
PISSN: 09574522
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1008937700655 Document Type: Article |
Times cited : (14)
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References (8)
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