Simulation of the image quality of an a-Si flat X-ray detector system in low dose fluoroscopic applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3977, Issue , 2000, Pages 117-127

  Bruijns, Tom J C ^a   Adriaansz, Thijs ^a   Cowen, Arnold R ^a   Davies, Andrew G ^a   Kengyelics, Stephen M ^a   Kiani, Kourosh ^a   Kroon, Han ^a   Luijendijk, Hans ^a  

^a PHILIPS HEALTHCARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; DETECTORS; FLAT PANEL DISPLAYS; IMAGE QUALITY; IMAGING SYSTEMS; SEMICONDUCTING SELENIUM; SIGNAL TO NOISE RATIO; X RAY APPARATUS;

LOW DOSE FLUOROSCOPY; QUANTUM STATISTICS; THRESHOLD CONTRAST DETAIL DETECTABILITY; X RAY DETECTORS;

MEDICAL IMAGING;

EID: 0033740284     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.384484     Document Type: Conference Paper

References (19)