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Volumn 33, Issue 10, 2000, Pages 1161-1168

Residual quenching stresses in glass-coated amorphous ferromagnetic microwires

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATING COATINGS; GLASS; MAGNETOSTRICTION; RESIDUAL STRESSES; STRESS ANALYSIS; STRESS CONCENTRATION; STRESS RELAXATION; TENSORS; VISCOELASTICITY; WIRE;

EID: 0033740064     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/10/305     Document Type: Article
Times cited : (227)

References (18)
  • 16
    • 0000441493 scopus 로고
    • ed D R Uhlmann and N J Kreidl (New York: Academic)
    • Gardon R 1980 Glass: Science and Technology vol 5 ed D R Uhlmann and N J Kreidl (New York: Academic) p 145
    • (1980) Glass: Science and Technology , vol.5 , pp. 145
    • Gardon, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.