Scatter rejection methods in megavoltage imaging with an amorphous silicon flat panel array

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3977, Issue , 2000, Pages 601-608

  Groh, Burkhard A ^a   Spies, Lothar ^a   Hesse, Bernd M ^a   Bortfeld, Thomas ^a  

^a GERMAN CANCER RESEARCH CENTER DKFZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COMPUTER SIMULATION; COMPUTERIZED TOMOGRAPHY; DOSIMETRY; IMAGE RECONSTRUCTION; IMAGE SEGMENTATION; MONTE CARLO METHODS; PHOTODIODES; X RAY SCATTERING;

ELECTRONIC PORTAL IMAGING; MEGAVOLTAGE COMPUTED TOMOGRAPHY (MVCT);

MEDICAL IMAGING;

EID: 0033739848     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.384537     Document Type: Conference Paper

References (11)