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Volumn 9, Issue 3, 2000, Pages 786-791
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New method to determine laser damage threshold for thin diamond-like carbon films on silicon
a a,b a c c |
Author keywords
[No Author keywords available]
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Indexed keywords
LASER ABLATION;
NEODYMIUM LASERS;
PHOTOEMISSION;
PULSED LASER APPLICATIONS;
RAMAN SPECTROSCOPY;
SENSITIVITY ANALYSIS;
SILICON;
THIN FILMS;
DIAMOND-LIKE CARBON (DLC) FILMS;
LASER-INDUCED PHOTOEMISSIONS;
AMORPHOUS FILMS;
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EID: 0033737810
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(99)00272-1 Document Type: Article |
Times cited : (21)
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References (7)
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