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Volumn 9, Issue 3, 2000, Pages 786-791

New method to determine laser damage threshold for thin diamond-like carbon films on silicon

Author keywords

[No Author keywords available]

Indexed keywords

LASER ABLATION; NEODYMIUM LASERS; PHOTOEMISSION; PULSED LASER APPLICATIONS; RAMAN SPECTROSCOPY; SENSITIVITY ANALYSIS; SILICON; THIN FILMS;

EID: 0033737810     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00272-1     Document Type: Article
Times cited : (21)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.