Micellar growth, network formation, and criticality in aqueous solutions of the nonionic surfactant C12E5

Langmuir

Volumn 16, Issue 9, 2000, Pages 4131-4140

  Bernheim Groswasser, A ^a   Wachtel, E ^b   Talmon, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; ETHERS; GROWTH (MATERIALS); LIGHT SCATTERING; MICELLES; MICROSTRUCTURE; MOLECULAR WEIGHT; PHASE DIAGRAMS; PHASE SEPARATION; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; WATER;

DYNAMIC LIGHT SCATTERING; MICELLAR GROWTH; NONIONIC SURFACTANT;

SURFACE ACTIVE AGENTS;

EID: 0033736881     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la991231q     Document Type: Article

References (57)

1. Corti, M.; Degiorgio, V. J. Phys. Chem. 1981, 55, 1442.
2. Corti, M.; Minero, C.; Degiorgio, V. J. Phys. Chem. 1984, 88, 309.
3. Blankschtein, D.; Thurston, G. M.; Benedek, G. B. J. Chem. Phys. 1986, 85, 7268.
4. Balmbra, R. R.; Clunie, J. S.; Corkill, J. M.; Goodman, J. F. Trans. Faraday Soc. 1962, 58, 1661.
5. Balmbra, R. R.; Clunie, J. S.; Corkill, J. M.; Goodman, J. F.Trans. Faraday Soc. 1964, 60, 979.
6. Tlusty, T.; Safran, S. A.; Menes, R.; Strey, R. Phys. Rev. Lett. 1997, 78, 2616.
7. Bernheim-Groswasser, A.; Tlusty, T.; Safran, S. A.; Talmon, Y. Langmuir 1999, 15, 5448.
8. Lequeux., F.; Candau, S. J. In Structure and Flow in Surfactant Solutions; Herb, C. A., Prud'homme, R. K., Eds.; ACS Symposium series 578; American Chemical Society: Washington, DC, 1994; p 51.
9. Candau, S. J.; Khatory, A.; Lequeux, F.; Kern, F. J. Physique IV 1993, 3, 197.
10. Appell, J.; Porte, G.; Khatory, A.; Kern, F.; Candau S. J. J. Phys. II (France) 1992, 2, 1045.
11. Drye, T. J.; Cates, M. E. J. Phys. Chem. 1992, 96, 1367.
12. Bohbot, Y.; Ben-Shaul, A.; Granek, R.; Gelbart, W. M. J. Chem. Phys. 1995, 103, 8764.
13. Danino, D.; Talmon, Y.; Levy, H.; Beinert, G.; Zana, R. Science 1995, 269, 1420.
14. Oda, R.; Panizza, P.; Schmutz, M.; Lequeux, F. Langmuir 1997, 13, 6407.
15. Lin, Z. Langmuir 1996, 12, 1729.
16. Strey, R.; Schomacker, R.; Roux, D.; Nallet, F.; Olsson, U. J. Chem. Soc., Faraday Trans. 1990, 86, 2253.
17. Strey, R. Ber. Bunsen-Ges. Phys. Chem. 1996, 100, 182.
18. Nilsson, P. G.; Wennerström, H.; Lindman, B. J. Phys. Chem. 1983, 87, 1377.
19. Martin, A.; Lesemann, M.; Belkoura, L.; Woermann, D. J. Phys. Chem. 1996, 100, 13760.
20. Kato, T.; Anzai, S.; Takano, S.; Seimiya, T. J. Chem. Soc., Faraday Trans. 1 1989, 85, 2499.
21. Kato, T.; Anzai, S.; Seimiya, T. J. Phys. Chem. 1990, 94, 7255.
22. Appell, J.; Porte, G. J. Phys. Lett. 1983, 44, L-689. Porte, G.; Appell, J. In Physics of Amphiphiles: Micelles, Vesicles and Microemulsions; Degiorgio, V., Corti, M., Eds.; North-Holland Physics Publishing: Amsterdam, 1985; p 461.
23. Appell, J.; Porte, G. J. Phys. Lett. 1983, 44, L-689. Porte, G.; Appell, J. In Physics of Amphiphiles: Micelles, Vesicles and Microemulsions; Degiorgio, V., Corti, M., Eds.; North-Holland Physics Publishing: Amsterdam, 1985; p 461.
24. Safran, S. A.; Turkevitch, L A.; Pincus, P. J. Physique Lett. 1984, 45, L-69.
25. Cabane, B.; Duplessix, R.; Zemb, Th. In Surfactant in Solutions; Lindman, B., Mittal, K., Eds.; Plenum Press: New York, 1984.
26. Lin, Z.; Scriven, L. E.; Davis, H. T. Langmuir 1992, 8, 2200.
27. Cates, M. E.; Candau, S. J. J. Phys.: Condens. Matter 1990, 2, 6869 and references therein.
28. Israelachvili, J. N.; Mitchell, D. J.; Ninham, B. W. J. Chem. Soc., Faraday Trans. 2 1976, 72, 1525.
29. Talmon, Y. In Modern Characterization Methods of Surfactant Systems; Binks, B. P., Ed.; Marcel Dekker: New York, 1999; p 147.
30. Moreels, E.; De Ceuninck, W.; Finsy, R. J. Chem. Phys. 1987, 86, 618.
31. Provencher, S. Comput. Phys. Commun. 1982, 27, 229.
32. Lang, J.; Zana, R. In Surfactant in Solutions; Zana, R., Ed.; Marcel Dekker: New York, 1987; p 405 and references therein.
33. Richtering, W. H.; Burchard, W.; Jahns, E.; Finkelmann, H. J. Phys. Chem. 1988, 92, 6032.
34. -3 wt % (see Schubert, K.-V.; Strey, R.; Kahlweit, M. J. Colloid Interface Sci. 1991, 141, 21). This is much lower than the surfactant concentrations used here. The temperature dependence of the CMC is not available, but, for example, we were unable to detect excess scattering from such a binary mixture at 25 °C. Accordingly, the weighed-in values of surfactant were used to determine the relevant concentrations.
35. de Gennes, P. G. Scaling Concepts in Polymer Physics; Cornell University Press: Ithaca, New York, 1976.
36. Shurtenberger, P.; Mazer, N.; Känzig, W. J. Phys. Chem. 1983, 87, 308.
37. Schaefer, D. W.; Joanny, J. F.; Pincus, P. Macromolecules 1980, 13, 1280.
38. Danino, D.; Bernheim-Groswasser, A.; Talmon, Y. Langmuir, submitted for publication.
39. Tlusty, T.; Safran, S. A. J. Phys. Condens. Matter 2000, 12, 1. These calculations were basically made for microemulsions and thus use the familiar Helfrich curvature energy expression (see Helfrich, W. Z. Naturforsch. 1973, 28c, 693) valid only for small curvature deformations, thus not valid for micelles. However, it was shown that this crude approximation provides a reasonable estimation of micelle properties; see May, S.; Bohbot, Y.; Ben-Shaul, A. J. Phys. Chem. B 1997, 101, 8648.
40. Tlusty, T.; Safran, S. A. J. Phys. Condens. Matter 2000, 12, 1. These calculations were basically made for microemulsions and thus use the familiar Helfrich curvature energy expression (see Helfrich, W. Z. Naturforsch. 1973, 28c, 693) valid only for small curvature deformations, thus not valid for micelles. However, it was shown that this crude approximation provides a reasonable estimation of micelle properties; see May, S.; Bohbot, Y.; Ben-Shaul, A. J. Phys. Chem. B 1997, 101, 8648.
41. Tlusty, T.; Safran, S. A. J. Phys. Condens. Matter 2000, 12, 1. These calculations were basically made for microemulsions and thus use the familiar Helfrich curvature energy expression (see Helfrich, W. Z. Naturforsch. 1973, 28c, 693) valid only for small curvature deformations, thus not valid for micelles. However, it was shown that this crude approximation provides a reasonable estimation of micelle properties; see May, S.; Bohbot, Y.; Ben-Shaul, A. J. Phys. Chem. B 1997, 101, 8648.
42. Surfactant molecules residing in larger spherical end-caps can pack in lower curved surface, with smaller area per headgroup than if the two radii were equal, thus minimizing their packing free energy (see Bernheim-Groswasser, A.; Zana, R.; Talmon, Y. and references therein; J. Phys. Chem. B, in press.
43. Medhage, B.; Mats, A.; Jan, A. J. Phys. Chem. 1993, 97, 7753.
44. Glatter, O.; Strey, R.; Schubert, K. V.; Kaler, E. W. Ber. Bunsen-Ges. Phys. Chem. 1996, 100, 323.
45. When rotational contribution to the entropy is taken into account, α is found to be smaller than 1/2; see McMullen, W. E.; Gelbart, W. M.; Ben-Shaul, A. J. Phys. Chem. 1984, 88, 6649.
46. Appell, J.; Porte, G.; Berret, J. F.; Roux, D. C. Prog. Colloid. Polymer Sci. 1994, 97, 233.
47. Buhler, E.; Munch, J. P.; Candau, S. J. J. Phys. II (France) 1995, 5, 765.
48. Magid, L. J. J. Phys. Chem. B 1998, 102, 4064 and references therein.
49. Harding, S. E. Biophys. Chem. 1995, 55, 69. Doi, M.; Edwards, S. F. In The Theory of Polymer Dynamics; Oxford University Press: Oxford, 1986.
50. Harding, S. E. Biophys. Chem. 1995, 55, 69. Doi, M.; Edwards, S. F. In The Theory of Polymer Dynamics; Oxford University Press: Oxford, 1986.
51. Strey, R.; Pakusch, A. Proceeding of the Fifth International Symposium on Surfactants in Solutions; Bordeaux, 1984; Vol. 4, p 465. Mittal, K. L., Bothorel, P., Eds.; Plenum Press: New York, 1986.
52. Strey, R. Colloid Polym. Sci. 1994, 272, 1005.
53. Blankschtein, D.; Thurston, G. M.; Benedek, G. B. Phys. Rev. Lett. 1985, 54, 955.
54. Kern, F.; Lequeux, F.; Zana, R.; Candau, S. J. Langmuir 1994, 10, 1714.
55. Hassan, P. A.; Valanlikar, B. S.; Manohar, C.; Kern, F.; Bourdieu, L.; Caudau, S. J. Langmuir 1996, 12, 4350.
56. Candau, S. J.; Hirsch, E.; Zana, R.; Deslanti, M. Langmuir 1989, 5, 1225.
57. Tlusty, T.; Safran, S. A.; Strey, R. Phys. Rev. Lett. 2000, 84, 1224.