Design and calibration of a noise measurement system

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 1, 2000, Pages 77-82

  Chen, Chun Yu ^b,c   Kuan, Chieh Hsiung ^a,b  

^a IEEE

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c Agilent Technologies Taiwan Ltd   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CALIBRATION; CAPACITANCE; CORRELATION METHODS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; FAST FOURIER TRANSFORMS; JUNCTION GATE FIELD EFFECT TRANSISTORS; NOISE GENERATORS; RESISTORS; THERMAL NOISE;

AMPLIFIER NOISE; POWER SPECTRAL DENSITY;

SIGNAL NOISE MEASUREMENT;

EID: 0033736694     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.836313     Document Type: Article

References (24)

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