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Volumn 44, Issue 6, 2000, Pages 1059-1067

Proportional difference operator method and its application in studying subthreshold behavior of MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; THRESHOLD VOLTAGE; VOLTAGE MEASUREMENT;

EID: 0033736622     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00318-4     Document Type: Article
Times cited : (11)

References (18)
  • 1
    • 0042973508 scopus 로고
    • In: Physics of the MOS Transistor
    • AD Kahng ed. New York: Academic Press
    • Brews JR. In: Physics of the MOS Transistor. AD Kahng ed. Applied Solid State Science, Suppl. 2A. New York: Academic Press, 1981.
    • (1981) Applied Solid State Science
    • Brews, J.R.1
  • 3
    • 0343781432 scopus 로고    scopus 로고
    • ASTM Standard F617: Standard method for measuring MOSFET linear threshold voltage, 1998
    • Am Soc Test Mat. Philadelphia
    • ASTM Standard F617: Standard method for measuring MOSFET linear threshold voltage, 1998. Annual Book of ASTM Standards, Am Soc Test Mat. Philadelphia. 1998.
    • (1998) Annual Book of ASTM Standards
  • 4
    • 0342910577 scopus 로고    scopus 로고
    • Standard method for measuring MOSFET saturated threshold voltage, 1998
    • ASTM Standard F1096 Am Soc Test Mat. Philadelphia
    • ASTM Standard F1096. Standard method for measuring MOSFET saturated threshold voltage, 1998. Annual Book of ASTM Standards, Am Soc Test Mat. Philadelphia, 1998.
    • (1998) Annual Book of ASTM Standards
  • 5
    • 0027634353 scopus 로고
    • New experimental technique for fast and accurate extraction
    • Corsi F., Marzocca C., Portaca G.V. New experimental technique for fast and accurate extraction. Electron Lett. 29(15):1993;1358-1360.
    • (1993) Electron Lett , vol.29 , Issue.15 , pp. 1358-1360
    • Corsi, F.1    Marzocca, C.2    Portaca, G.V.3
  • 18
    • 84992229550 scopus 로고
    • Ph.D. Dissertation. Institute of Microelectronics, Peking University
    • Liu X. Ph.D. Dissertation. Institute of Microelectronics, Peking University, 1993.
    • (1993)
    • Liu, X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.