Three-dimensional analysis of decorated ceramic fracture surfaces by automatic stereophotogrammetry

Journal of the American Ceramic Society

Volumn 83, Issue 1, 2000, Pages 223-25

  Marschall, Hans Ulrich ^a   Danzer, Robert ^a   Pippan, Reinhard ^b  

^a UNIVERSITY OF LEOBEN   (Austria)

^b Erich Schmid Institute of Materials Science   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COMPUTER SIMULATION; FRACTURE; HEAT TREATMENT; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE;

FRACTURE FACETS; STEREOPHOTOGRAMMETRY;

FRACTOGRAPHY;

EID: 0033734178     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2000.tb01176.x     Document Type: Article

References (9)

1. T. Kobayashi and D. A. Shockey, "Fracture Analysis via FRASTA," Adv. Mater. Processes. 140 [6] 24-32 (1991).
2. 4 Matrix Composites." J. Mater. Sci., 26, 4491-98 (1991).
3. O. Kolednik and H. P. Stüwe, "The Stereophotogrammetric Determination of the Critical Crack Tip Opening Displacement." Eng. Fract. Mech., 21 [1] 145-55 (1985).
4. A. J. Krasowsky and W. A. Stepanenko, "A Quantitative Stereoscopic Fractographic Study of the Mechanism of Fatigue Crack Propagation in Nickel," Int. J. Fract., 15 [3] 203-15 (1979).
5. E. E. Underwood, Metals Handbook, Vol. 12, Fractography, 9th Ed.; pp. 199-210. American Society for Metals, Metals Park, OH, 1987.
6. G. Piazzesi, "Photogrammetry with the Scanning Electron Microscope," J. Phys. E: Sci. Instrum., 6, 392-96 (1973).
7. O. Kolednik, "A Contribution to Stereophotogrammetry with the Scanning Electron Microscope," Prakt. Metallogr., 18 [12] 562-73 (1981).
8. R. T. Frankot, S. Hensley, and S. Shafer, "Noise Resistant Estimation Techniques for SAR Image Registration and Stereomatching"; pp. 1151-53 in International Geoscience and Remote Sensing Symposium, (IGARSS). Institute of Electrical and Electronic Engineers (IEEE), New York, 1994.
9. J. Stampfl, S. Scherer, M. Gruber, and O. Kolednik, "Reconstruction of Surface Topographies by Scanning Electron Microscopy for Application in Fracture Research." Appl. Phys. A: Mater. Sci. Process., 63 [4] 341-46 (1996).