Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2000, Pages 420-424

  Chin, J M ^a   Phang, J C H ^a   Chan, D S H ^a   Soh, C E ^a   Gilfeather, G ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS;

SINGLE CONTACT OPTICAL BEAM INDUCED CURRENTS (SCOBIC);

INTEGRATED CIRCUIT TESTING;

EID: 0033733999     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)