Invariance-based on-line test for RTL controller-datapath circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 459-464

  Makris, Yiorgos ^a   Bayraktaroglu, Ismet ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ERROR DETECTION; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; ONLINE SYSTEMS;

ALGORITHMIC CONTROLLER DATAPATH INTERACTION; DATAPATH CIRCUITS; INVARIANCE BASED ON LINE TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0033733717     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)