High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 91, Issue 4, 2000, Pages 272-274

  Yu, R ^a   He, L L ^a   Jin, Z X ^a   Guo, J T ^a   Ye, H Q ^a   Lupinc, V ^b  

^a INSTITUTE OF METAL RESEARCH   (China)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; HOT ISOSTATIC PRESSING; PHASE TRANSITIONS; PRECIPITATION (CHEMICAL); TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL ELECTRON MICROSCOPY; LAMELLAR STRUCTURE;

METALLOGRAPHIC MICROSTRUCTURE;

EID: 0033733208     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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