Improved time-of-fiight technique for measuring carrier mobility in thin films of organic electroluminescent materials

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 3 A, 2000, Pages 1190-1192

  Chen, Baijun ^a,b   Lee, Chun Sing ^a   Lee, Shuit Tong ^a   Webb, Patrick ^a   Chan, Yan Cheong ^a   Gambling, William ^a   Tian, He ^c   Zhu, Weihong ^c  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b JILIN UNIVERSITY   (China)

^c EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Carrier mobility; Organic EL materials; Time of flight

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; COATED MATERIALS; ELECTRIC FIELDS; LIGHT ABSORPTION; ORGANIC CONDUCTORS; PLASTIC FILMS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING SILICON; SIGNAL TO NOISE RATIO; SUBSTRATES; THIN FILMS;

INDIUM TIN OXIDE; MOBILITY MEASUREMENT; ORGANIC ELECTROLUMINESCENT MATERIALS; TIME OF FLIGHT TECHNIQUE;

CARRIER MOBILITY;

EID: 0033732949     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.1190     Document Type: Article

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