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Volumn 451, Issue 1, 2000, Pages 31-40
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Incident beam diffraction in electron stimulated desorption
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
ELECTRON BEAMS;
ELECTRON DIFFRACTION;
POSITIVE IONS;
SEMICONDUCTING SILICON;
SURFACE CHEMISTRY;
ELECTRON STIMULATED DESORPTION (ESD);
ELECTRON-SOLID INTERACTIONS;
DESORPTION;
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EID: 0033732936
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)00005-4 Document Type: Article |
Times cited : (6)
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References (24)
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