Simulation of the drain current and transconductance as functions of the source voltage observed in two-terminal diodes fabricated utilizing a focused ion-beam technique

Solid State Communications

Volumn 115, Issue 2, 2000, Pages 77-80

  Kim, T W ^a   Choo, D C ^a   Shim, J H ^a   Kim, J H ^a   Kang, S O ^a  

^a Kwangwoon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; TRANSCONDUCTANCE;

COULOMB STAIRCASE; FOCUSED ION BEAM TECHNIQUES;

SEMICONDUCTOR DIODES;

EID: 0033732878     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00144-7     Document Type: Article

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