Channel-width dependent hot-carrier degradation of thin-gate pMOSFETs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2000, Pages 77-82

  Lee, Y H ^a   Wu, K ^a   Linton, T ^a   Mielke, N ^a   Hu, S ^a   Wallace, B ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; GATES (TRANSISTOR); HOT CARRIERS; SEMICONDUCTOR DEVICE MODELS;

SHALLOW TRENCH ISOLATION (STI);

MOSFET DEVICES;

EID: 0033731807     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)