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Volumn , Issue , 2000, Pages 289-294
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Transmission Line Model testing of top-gate amorphous silicon thin film transistors
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ELECTRIC BREAKDOWN OF SOLIDS;
ELECTRIC DISCHARGES;
ELECTROSTATICS;
FAILURE ANALYSIS;
INTERFACES (COMPUTER);
MATHEMATICAL MODELS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE TESTING;
THRESHOLD VOLTAGE;
TRANSMISSION LINE THEORY;
DIELECTRIC BREAKDOWN;
ELECTROSTATIC DISCHARGES (ESD);
THIN FILM TRANSISTORS;
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EID: 0033731018
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
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Times cited : (12)
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References (12)
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