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Volumn 24, Issue 1, 2000, Pages 15-23

6-Degree-of-freedom measurement system for the accuracy of X-Y stages

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); DOPPLER EFFECT; LASER APPLICATIONS; LIGHT REFLECTION; PRECISION ENGINEERING;

EID: 0033730123     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0141-6359(99)00021-5     Document Type: Article
Times cited : (116)

References (16)
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  • 4
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    • A multi-degree-of-freedom measuring system for CMM geometric errors
    • Ni J, Huang PS, Wu SM. A multi-degree-of-freedom measuring system for CMM geometric errors. J Engng Ind, Trans ASME, 1992, 114: 362-9.
    • (1992) J Engng Ind, Trans ASME , vol.114 , pp. 362-369
    • Ni, J.1    Huang, P.S.2    Wu, S.M.3
  • 5
    • 0029304427 scopus 로고
    • On-line error compensation of coordinate measuring machines
    • Huang PS, Ni J. On-line error compensation of coordinate measuring machines. Int J Mach Tools Manufact, 1995, 35: 725-38.
    • (1995) Int J Mach Tools Manufact , vol.35 , pp. 725-738
    • Huang, P.S.1    Ni, J.2
  • 6
    • 0031139754 scopus 로고    scopus 로고
    • CCD-based CMM geometrical error measurement using fourier phase shift algorithm
    • Chou C, Chou LY, Peng CK, Fan KC. CCD-based CMM geometrical error measurement using fourier phase shift algorithm. Int J Mach Tools Manufact, 1997, 37: 579-90.
    • (1997) Int J Mach Tools Manufact , vol.37 , pp. 579-590
    • Chou, C.1    Chou, L.Y.2    Peng, C.K.3    Fan, K.C.4
  • 7
    • 0007176883 scopus 로고
    • Reflection device of autocollimator for measuring the three components of angular alignment
    • Tanimura Y. Reflection device of autocollimator for measuring the three components of angular alignment. Int J Japan Soc Prec Eng, 1994, 28: 275-6.
    • (1994) Int J Japan Soc Prec Eng , vol.28 , pp. 275-276
    • Tanimura, Y.1
  • 8
    • 0001464846 scopus 로고
    • Simultaneous measuring method of table motion errors in 6 degrees of freedom
    • Shimizu S, Lee, HS, Imai N. Simultaneous measuring method of table motion errors in 6 degrees of freedom. Int J Japan Soc Prec Eng, 1994, 28: 273-4.
    • (1994) Int J Japan Soc Prec Eng , vol.28 , pp. 273-274
    • Shimizu, S.1    Lee, H.S.2    Imai, N.3
  • 9
    • 0032020934 scopus 로고    scopus 로고
    • A six-degree-of-freedom measurement system for the motion accuracy of linear stages
    • Fan KC, Chen MJ, Huang WM. A six-degree-of-freedom measurement system for the motion accuracy of linear stages. Int J Mach Tools Manufact, 1998, 38: 155-64.
    • (1998) Int J Mach Tools Manufact , vol.38 , pp. 155-164
    • Fan, K.C.1    Chen, M.J.2    Huang, W.M.3
  • 10
    • 0003811187 scopus 로고
    • Englewood Cliffs, N.J.: Prentice-Hall
    • Slocum AH. Precision Machine Design. Englewood Cliffs, N.J.: Prentice-Hall, 1992: 196.
    • (1992) Precision Machine Design , pp. 196
    • Slocum, A.H.1
  • 11
    • 0007315776 scopus 로고
    • Linear/angular displacement interferometer for wafer stage metrology
    • Sommargren GE. Linear/angular displacement interferometer for wafer stage metrology. Proc SPIE, 1989: 1088: 268-72.
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    • Sommargren, G.E.1
  • 12
    • 0027609850 scopus 로고
    • Microscopic coordinate measurement by four-beam laser interferometry
    • Nakamura O, Goto M. Microscopic coordinate measurement by four-beam laser interferometry. J Japan Soc Prec Eng, 1993, 59: 155-60.
    • (1993) J Japan Soc Prec Eng , vol.59 , pp. 155-160
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    • Critical alignments in plane mirror interferometry
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.