-
1
-
-
0003313458
-
Geometric and kinematic errors
-
Weck MM. Geometric and kinematic errors. Technology of Machine Tools, 1980, 5: 9-12.
-
(1980)
Technology of Machine Tools
, vol.5
, pp. 9-12
-
-
Weck, M.M.1
-
3
-
-
0007296223
-
Development of multi-function error calibration system for NC machine tools
-
Taipei, Taiwan
-
Fang CY, Fan KC. Development of multi-function error calibration system for NC machine tools. Proc. of the 3rd ROC-ROK Metrology Symposium, 1990, (Taipei, Taiwan): 163-71.
-
(1990)
Proc. of the 3rd ROC-ROK Metrology Symposium
, pp. 163-171
-
-
Fang, C.Y.1
Fan, K.C.2
-
4
-
-
85012101907
-
A multi-degree-of-freedom measuring system for CMM geometric errors
-
Ni J, Huang PS, Wu SM. A multi-degree-of-freedom measuring system for CMM geometric errors. J Engng Ind, Trans ASME, 1992, 114: 362-9.
-
(1992)
J Engng Ind, Trans ASME
, vol.114
, pp. 362-369
-
-
Ni, J.1
Huang, P.S.2
Wu, S.M.3
-
5
-
-
0029304427
-
On-line error compensation of coordinate measuring machines
-
Huang PS, Ni J. On-line error compensation of coordinate measuring machines. Int J Mach Tools Manufact, 1995, 35: 725-38.
-
(1995)
Int J Mach Tools Manufact
, vol.35
, pp. 725-738
-
-
Huang, P.S.1
Ni, J.2
-
6
-
-
0031139754
-
CCD-based CMM geometrical error measurement using fourier phase shift algorithm
-
Chou C, Chou LY, Peng CK, Fan KC. CCD-based CMM geometrical error measurement using fourier phase shift algorithm. Int J Mach Tools Manufact, 1997, 37: 579-90.
-
(1997)
Int J Mach Tools Manufact
, vol.37
, pp. 579-590
-
-
Chou, C.1
Chou, L.Y.2
Peng, C.K.3
Fan, K.C.4
-
7
-
-
0007176883
-
Reflection device of autocollimator for measuring the three components of angular alignment
-
Tanimura Y. Reflection device of autocollimator for measuring the three components of angular alignment. Int J Japan Soc Prec Eng, 1994, 28: 275-6.
-
(1994)
Int J Japan Soc Prec Eng
, vol.28
, pp. 275-276
-
-
Tanimura, Y.1
-
8
-
-
0001464846
-
Simultaneous measuring method of table motion errors in 6 degrees of freedom
-
Shimizu S, Lee, HS, Imai N. Simultaneous measuring method of table motion errors in 6 degrees of freedom. Int J Japan Soc Prec Eng, 1994, 28: 273-4.
-
(1994)
Int J Japan Soc Prec Eng
, vol.28
, pp. 273-274
-
-
Shimizu, S.1
Lee, H.S.2
Imai, N.3
-
9
-
-
0032020934
-
A six-degree-of-freedom measurement system for the motion accuracy of linear stages
-
Fan KC, Chen MJ, Huang WM. A six-degree-of-freedom measurement system for the motion accuracy of linear stages. Int J Mach Tools Manufact, 1998, 38: 155-64.
-
(1998)
Int J Mach Tools Manufact
, vol.38
, pp. 155-164
-
-
Fan, K.C.1
Chen, M.J.2
Huang, W.M.3
-
10
-
-
0003811187
-
-
Englewood Cliffs, N.J.: Prentice-Hall
-
Slocum AH. Precision Machine Design. Englewood Cliffs, N.J.: Prentice-Hall, 1992: 196.
-
(1992)
Precision Machine Design
, pp. 196
-
-
Slocum, A.H.1
-
11
-
-
0007315776
-
Linear/angular displacement interferometer for wafer stage metrology
-
Sommargren GE. Linear/angular displacement interferometer for wafer stage metrology. Proc SPIE, 1989: 1088: 268-72.
-
(1989)
Proc SPIE
, vol.1088
, pp. 268-272
-
-
Sommargren, G.E.1
-
12
-
-
0027609850
-
Microscopic coordinate measurement by four-beam laser interferometry
-
Nakamura O, Goto M. Microscopic coordinate measurement by four-beam laser interferometry. J Japan Soc Prec Eng, 1993, 59: 155-60.
-
(1993)
J Japan Soc Prec Eng
, vol.59
, pp. 155-160
-
-
Nakamura, O.1
Goto, M.2
-
13
-
-
0026843406
-
A 6-axes motion control method for parallel-linkage-type fine motion stage
-
Tomita Y, Kodaira K, Satoh F, Itoh K, Koyanagawa Y. A 6-axes motion control method for parallel-linkage-type fine motion stage. J Japan Soc Prec Eng, 1992: 58: 684-90.
-
(1992)
J Japan Soc Prec Eng
, vol.58
, pp. 684-690
-
-
Tomita, Y.1
Kodaira, K.2
Satoh, F.3
Itoh, K.4
Koyanagawa, Y.5
-
14
-
-
0027202863
-
Critical alignments in plane mirror interferometry
-
Bobroff N. Critical alignments in plane mirror interferometry. Prec Eng, 1993, 15: 33-8.
-
(1993)
Prec Eng
, vol.15
, pp. 33-38
-
-
Bobroff, N.1
-
15
-
-
0018211625
-
Silicon position sensing detectors for precision measurement and control
-
Madden RM. Silicon position sensing detectors for precision measurement and control. Advances in Optical Metrology, Proc SPIE, 1978, 153: 101-7.
-
(1978)
Advances in Optical Metrology, Proc SPIE
, vol.153
, pp. 101-107
-
-
Madden, R.M.1
|