InGaAlP and InGaN light-emitting diodes: High-power performance and reliability

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3938, Issue , 2000, Pages 44-51

  Eliashevich, Ivan ^a   Debray, Jean Philippe ^a   Tran, Chuong A ^a   Venugopalan, Hari ^a   Karlicek Jr , Robert F ^a  

^a EMCORE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTROOPTICAL EFFECTS; RELIABILITY; SEMICONDUCTING INDIUM COMPOUNDS;

ELECTRICAL-TO-OPTICAL CONVERSION EFFICIENCY;

LIGHT EMITTING DIODES;

EID: 0033729812     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)