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Volumn 35, Issue 11, 2000, Pages 2833-2839

Direct synthesis of potassium tantalate thin films by hydrothermal-electrochemical method

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITANCE MEASUREMENT; CRYSTAL STRUCTURE; FERROELECTRIC MATERIALS; FILM PREPARATION; MORPHOLOGY; PERMITTIVITY; POTASSIUM COMPOUNDS; SPECTROSCOPY; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

EID: 0033729538     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004703420342     Document Type: Article
Times cited : (14)

References (45)
  • 3
    • 0030609253 scopus 로고    scopus 로고
    • D. J. SINGH, ibid. 194 (1997) 299.
    • (1997) Ibid. , vol.194 , pp. 299
    • Singh, D.J.1
  • 4
    • 0031389164 scopus 로고    scopus 로고
    • H. VOGT, ibid. 202 (1997) 157.
    • (1997) Ibid. , vol.202 , pp. 157
    • Vogt, H.1
  • 5
    • 85021275120 scopus 로고    scopus 로고
    • Idem., ibid. 184 (1996) 31
    • Idem., ibid. 184 (1996) 31.
  • 27
    • 85021264771 scopus 로고    scopus 로고
    • Model MXP 3VA, MAC Science Co., LTD., Tokyo, Japan, PDF number is No. 351464
    • Database of XRD instrument, Model MXP 3VA, MAC Science Co., LTD., Tokyo, Japan, PDF number is No. 351464.
    • Database of XRD Instrument
  • 37
    • 85021263101 scopus 로고
    • Ph.D. Dissertation, Tokyo Institute of Technology, Japan
    • N. WAKIYA, Ph.D. Dissertation, Tokyo Institute of Technology, Japan, 1995.
    • (1995)
    • Wakiya, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.