Truncated Dempster-Shafer optimization and benchmarking

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4051, Issue , 2000, Pages 237-246

  Valin, Pierre ^a   Boily, David ^a  

^a Lockheed Martin Canada   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ARTIFICIAL INTELLIGENCE; DATABASE SYSTEMS; REAL TIME SYSTEMS;

EVIDENTIAL REASONING; TRUNCATED DEMPSTER-SHAFER (TDS);

SENSOR DATA FUSION;

EID: 0033729107     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)