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Volumn , Issue , 2000, Pages 235-240
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Dominated energy dissipation in ultrathin single crystal silicon cantilever: Surface loss
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
ENERGY DISSIPATION;
Q FACTOR MEASUREMENT;
SEMICONDUCTING FILMS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON NITRIDE;
SINGLE CRYSTALS;
SURFACE STRUCTURE;
SURFACE TREATMENT;
ULTRATHIN FILMS;
VACUUM APPLICATIONS;
CANTILEVERS;
MICROELECTROMECHANICAL DEVICES;
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EID: 0033727391
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (10)
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References (13)
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