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Volumn 168, Issue 4, 2000, Pages 543-552

Detailed analysis of the resonant backscattering spectrum for deeply penetrating protons in carbon

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER SOFTWARE; PARTICLE BEAMS; PROTONS; RESONANCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0033726851     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00062-8     Document Type: Article
Times cited : (13)

References (11)
  • 3
    • 0009332031 scopus 로고
    • in: O. Meyer, G. Linker, F. Kappeler (Eds.), Plenum, New York
    • G. Deconninck, Y. Fouilhe, in: O. Meyer, G. Linker, F. Kappeler (Eds.), Ion Beam Surface Layer Analysis, Vol. I, Plenum, New York, 1976, p. 87.
    • (1976) Ion Beam Surface Layer Analysis , vol.1 , pp. 87
    • Deconninck, G.1    Fouilhe, Y.2
  • 8
    • 0004077682 scopus 로고    scopus 로고
    • Techical Report IPP 9/113, Max-Planck-Institut für Plasmaphysik, Garching
    • M. Mayer, SIMNRA user's Guide, Techical Report IPP 9/113, Max-Planck-Institut für Plasmaphysik, Garching, 1997.
    • (1997) SIMNRA User's Guide
    • Mayer, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.