New kind of bend sensor and its application

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4077, Issue , 2000, Pages 272-275

  Yuan, Kui ^a   Ma, Xiaojun ^a   Yi, Jianhui ^a   Zhu, Haibing ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY; VIRTUAL REALITY;

BEND SENSOR; DATAGLOVE;

SENSORS;

EID: 0033726604     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)