Extraction of the channel thermal noise in MOSFETs

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2000, Pages 42-47

  Chen, Chih Hung ^a   Deen, M Jamal ^a   Matloubian, Mishel ^a   Cheng, Yuhua ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR JUNCTIONS; SIGNAL NOISE MEASUREMENT; THERMAL NOISE; TRANSCONDUCTANCE;

CHANNEL THERMAL NOISE; DRAIN RESISTANCE; GATE RESISTANCE; OUTPUT RESISTANCE; SOURCE RESISTANCE;

MOSFET DEVICES;

EID: 0033726580     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)