Study of the Na2O-CaO-P2O5-SiO2 system with respect to the behaviour of phosphate bonded basic refractories at high temperature

Journal of the European Ceramic Society

Volumn 20, Issue 8, 2000, Pages 1169-1178

  Rivenet, M ^a   Cousin, O ^a   Boivin, J C ^a   Abraham, F ^a   Ruchaud, N ^b   Hubert, P ^b  

^a UNITÉ DE CATALYSE ET DE CHIMIE DU SOLIDE   (France)

^b TRB   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ENERGY DISPERSIVE SPECTROSCOPY; HIGH TEMPERATURE EFFECTS; MECHANICAL PROPERTIES; PHASE EQUILIBRIA; PHOSPHATES; SOLID SOLUTIONS; X RAY POWDER DIFFRACTION;

PHOSPHATE BONDING; SILICOPHOSPHATE; X RAY FLUORESCENCE ANALYSES; X RAY THERMODIFFRACTOMETRY;

REFRACTORY MATERIALS;

EID: 0033726180     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(99)00276-9     Document Type: Article

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