Anomalous ultra-small-angle X-ray scattering from evolving microstructures during tensile creep

Materials Research Society Symposium - Proceedings

Volumn 590, Issue , 2000, Pages 131-136

  Jemian, P R ^a   Long, G G ^a   Lofaj, F ^b   Wiederhorn, S M ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CREEP TESTING; DEFORMATION; FUSED SILICA; POROSITY; SILICON NITRIDE; TENSILE TESTING; X RAY SCATTERING; YTTERBIUM COMPOUNDS; YTTRIUM COMPOUNDS;

ULTRA-SMALL-ANGLE X RAY SCATTERING (USAXS);

CRYSTAL MICROSTRUCTURE;

EID: 0033725780     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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5. The use of commercial designations or company names is for identification only and does not indicate endorsement by the National Institute of Standards and Technology.
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