Impact of technology scaling on CMOS RF devices and circuits

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2000, Pages 361-364

  Abou Allam, E ^a   Manku, T ^a   Ting, M ^a   Obrecht, M S ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); BIPOLAR TRANSISTORS; CAPACITANCE; ELECTRIC CURRENTS; MATHEMATICAL MODELS; MICROWAVE INTEGRATED CIRCUITS; MOS DEVICES; MOSFET DEVICES; SPURIOUS SIGNAL NOISE; TRANSCONDUCTANCE;

CMOS FRONT END CIRCUIT; LOW NOISE AMPLIFIER; OXIDE CAPACITANCE; UNITY CURRENT GAIN FREQUENCY;

CMOS INTEGRATED CIRCUITS;

EID: 0033725612     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)