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Volumn 38, Issue 13, 2000, Pages 1839-1843
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Influence of Ti, Fe, and Cu metal submicron-particles on diamond CVD on Si substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
COPPER;
CRYSTAL GROWTH;
IRON;
NANOSTRUCTURED MATERIALS;
NUCLEATION;
PARTICLE SIZE ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
SILICON;
SUBSTRATES;
TITANIUM;
NANO-SIZED METAL PARTICLES;
DIAMONDS;
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EID: 0033725570
PISSN: 00086223
EISSN: None
Source Type: Journal
DOI: 10.1016/S0008-6223(00)00019-1 Document Type: Article |
Times cited : (21)
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References (10)
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