Select transistor modulated cell array structure test for EEPROM reliability

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2000, Pages 217-222

  Pio, Federico ^a   Gomiero, Enrico ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CELLULAR ARRAYS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; GATES (TRANSISTOR); OPTIMIZATION; RELIABILITY; THRESHOLD VOLTAGE; TRANSCONDUCTANCE; TRANSISTORS; VOLTAGE MEASUREMENT;

DRAIN CURRENT; EEPROM; SELECT TRANSISTOR MODULATED CELL ARRAY STRUCTURE TEST;

PROM;

EID: 0033724120     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)