Electrical resistivity as a characterization tool for nanocrystalline metals

Materials Research Society Symposium - Proceedings

Volumn 581, Issue , 2000, Pages 461-466

  McCrea, J L ^a   Aust, K T ^a   Palumbo, G ^b   Erb, U ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b Integran Technologies Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRODEPOSITION; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; METALS; POLYCRYSTALLINE MATERIALS; THERMAL EFFECTS; THERMODYNAMIC STABILITY;

CHARACTERIZATION TOOL; NANOCRYSTALLINE METALS; SPECIFIC GRAIN BOUNDARY RESISTIVITY;

NANOSTRUCTURED MATERIALS;

EID: 0033723916     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)