Study of Fowler-Nordheim tunneling current oscillations of thin insulator MOS structure by wave interference method

Solid-State Electronics

Volumn 44, Issue 8, 2000, Pages 1501-1506

  Mao, Lingfeng ^a   Tan, Changhua ^a   Xu, Mingzhen ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE INTERFERENCE; MIM DEVICES; OSCILLATIONS;

FOWLER-NORDHEIM TUNNELING CURRENT OSCILLATIONS;

MOS DEVICES;

EID: 0033723587     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00089-7     Document Type: Article

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