Search for complex order parameters in grain boundary junctions

Physica B: Condensed Matter

Volumn 284-288, Issue PART I, 2000, Pages 587-588

  Neils, W K ^a   Van Harlingen, D J ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Grain boundaries; Josephson junctions; Order parameter; YBaCuO patterned

Indexed keywords

COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL IMPURITIES; ELECTRIC CURRENT MEASUREMENT; GRAIN BOUNDARIES; MAGNETIC FIELD EFFECTS; OXIDE SUPERCONDUCTORS; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

ANDREEV REFLECTION; COMPLEX ORDER PARAMETERS;

JOSEPHSON JUNCTION DEVICES;

EID: 0033723334     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)02211-5     Document Type: Article

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