Electrically based non-destructive microstructural characterization of all classes of materials

Materials Research Society Symposium - Proceedings

Volumn 591, Issue , 2000, Pages 93-104

  Gerhardt, Rosario A ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATRIX COMPOSITES; CRYSTAL DEFECTS; CRYSTAL WHISKERS; ELECTRIC CONDUCTIVITY MEASUREMENT; FIBERS; METALS; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY MEASUREMENT; PORE SIZE; SPECTROSCOPY; SURFACES;

NONDESTRUCTIVE MICROSTRUCTURAL CHARACTERIZATION; POLYMER MATRIX COMPOSITES;

MICROSTRUCTURE;

EID: 0033722343     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (37)

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36. L.C. Cretegny, R.A. Gerhardt and A. Saxena, unpublished results.
37. J. R. Kokan, R.A.Gerhardt and Ching-Hua Su, "Dielectric Spectroscopy Study of ZnSe Grown by Physical Vapor Transport," Mat.Res.Symp.Proc. 487, 517-522(1998).