Dynamic materials evaluation by confined plasma ablation and laser-generated shocks

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4065, Issue , 2000, Pages 482-489

  Paisley, D L ^a   Swift, D C ^a   Forsman, A C ^a   Kyrala, G A ^a   Johnson, R P ^a   Kopp, R A ^a   Hauer, A A ^a   Wark, J S ^a   Loveridge, A ^a   Allen, A ^a   Kalantar, D H ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOND STRENGTH (MATERIALS); CRYSTAL LATTICES; INTERFACES (MATERIALS); MATERIALS TESTING; PLASMA CONFINEMENT; SINGLE CRYSTALS; STRAIN RATE; SYNCHRONIZATION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CONFINED PLASMA ABLATION; LASER GENERATED SHOCK; TRANSIENT X RAY DIFFRACTION;

LASER ABLATION;

EID: 0033722008     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.407370     Document Type: Conference Paper

References (14)