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Volumn , Issue , 2000, Pages 781-786
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Fabrication of a three-axis accelerometer integrated with commercial 0.8 μm-CMOS circuits
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
CHEMICAL POLISHING;
CMOS INTEGRATED CIRCUITS;
DEPOSITION;
ETCHING;
MASKS;
MICROMACHINING;
SILICA;
SILICON WAFERS;
BULK MICROMACHINED THREE-AXIS ACCELEROMETERS;
PHYSICAL VAPOR DEPOSITION (PVD);
ACCELEROMETERS;
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EID: 0033721561
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (8)
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References (6)
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