Static tester for characterization of optical near-field coupling phenomena

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4081, Issue , 2000, Pages 21-27

  Zijp, Ferry ^a   Martynov, Yourii V ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; LIGHT POLARIZATION; OPTICAL INSTRUMENT LENSES; REFRACTIVE INDEX;

EVANESCENT FIELD; SOLID IMMERSION LENS;

OPTICAL RECORDING;

EID: 0033720844     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)