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Volumn 578, Issue , 2000, Pages 363-367

Self-affine fractal characterization of a TNT fracture surface

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL REACTIONS; FRACTURE MECHANICS; IMAGE ANALYSIS; SPATIAL VARIABLES MEASUREMENT; SURFACE STRUCTURE; TOLUENE;

EID: 0033720828     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.