Electro-plastic effect in semiconductors

Materials Science and Engineering: A

Volumn 287, Issue 2, 2000, Pages 272-275

  Gilman, John J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Dember effect; Dislocation mobility; Electro plasticity; Indentation hardness; Surface charge

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRIC FIELD EFFECTS; ELECTRON ENERGY LEVELS; ENERGY GAP; HARDNESS; PLASTICITY; SURFACE PROPERTIES;

CHARGED SURFACE STATES; DEMBER EFFECT; DISLOCATION MOBILITY; ELECTROPLASTIC EFFECT; ENERGY BANDGAPS; INDENTATION HARDNESS; SURFACE CHARGE;

SEMICONDUCTOR MATERIALS;

EID: 0033719898     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(00)00785-1     Document Type: Article

References (7)

1. Westbrook J.H., Gilman J.J. J. Appl. Phys. 33:1962;2360.
2. Hanneman R.E., Jorgenson P.J. J. Appl. Phys. 38:1967;4099.
3. Ablova M.S., Kontorova T.A. Soviet Phys. Solid State. 10:1969;2000.
4. Kikuchi K., Saito M. J. Phys. Soc. Jpn. 14:1959;1462.
5. Ablova M.S., Mozgovaya L.A., Berdnikov E.P. Soviet Phys. Solid State. 11:1969;1168.
6. Gilman J.J. Science. 261:1993;1436.
7. Gilman J.J. Chu S.N.G., Liaw P.K., Arsenault R.J., Sadananda K., Chan K.S., Gerberich W.W., Chau C.C., Kung T.M. Micromechanics of Advanced Materials. 1995;3 The Minerals, Metals and Materials Society, Warrendale, PA.