Probe detectors for mapping manufacturing defects

Proceedings of the IEEE International Caracas Conference on Devices, Circuits and Systems, ICCDCS

Volumn , Issue , 2000, Pages

  Zanchi, A ^a   Zappa, F ^a   Ghioni, M ^a   Giudice, A ^a   Morrison, A P ^a   Sinnis, V S ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEFECTS; ELECTRIC BREAKDOWN; INSPECTION; MICROSCOPIC EXAMINATION; NUMERICAL METHODS; PROBES; SEMICONDUCTOR JUNCTIONS;

MANUFACTURING DEFECTS; PROBE DETECTORS; SINGLE PHOTON AVALANCHE DIODES; THERMAL GENERATION;

AVALANCHE DIODES;

EID: 0033719813     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)