Effects of scaling on the performance of small-signal MOS amplifiers: A physics-based simulation study

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 2000, Pages

  Fiegna, Claudio ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CARRIER MOBILITY; COMPUTER SIMULATION; MOSFET DEVICES;

METAL OXIDE SEMICONDUCTOR (MOS) AMPLIFIERS;

BROADBAND AMPLIFIERS;

EID: 0033719805     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2000.856433     Document Type: Conference Paper

References (9)