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Volumn 4, Issue , 2000, Pages
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Floating-gate techniques for assessing mismatch
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC NETWORK ANALYSIS;
GATES (TRANSISTOR);
MOS CAPACITORS;
CAPACITOR MISMATCH;
FLOATING GATE MOS TRANSISTORS;
MOSFET DEVICES;
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EID: 0033719764
PISSN: 02714310
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISCAS.2000.858769 Document Type: Conference Paper |
Times cited : (8)
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References (10)
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