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Volumn 558, Issue , 2000, Pages 603-608
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Analysis of measured I(V) relations for electron emission from insulating diamond films on various Si substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
ELECTRON EMISSION;
ELECTRON TRANSPORT PROPERTIES;
INTERFACES (MATERIALS);
SEMICONDUCTING SILICON;
SUBSTRATES;
SURFACE ROUGHNESS;
ELECTRON TRANSPORT MODEL;
FIELD EMISSION TOPOGRAPHY MAPPING;
FOWLER-NORDHEIM PLOT;
GEOMETRICAL INTERFACE ROUGHNESS MODEL;
INSULATING DIAMOND FILMS;
DIAMOND FILMS;
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EID: 0033719462
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (0)
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