Comparison study of ESD protection for RFIC's: performance vs. parasitics

Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium

Volumn , Issue , 2000, Pages 235-238

  Feng, Haigang ^a   Gong, Ke ^a   Wang, Albert Z ^a  

^a ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; ELECTRIC DISCHARGES; ELECTRIC RESISTANCE; ELECTROSTATICS; OPERATIONAL AMPLIFIERS; OSCILLATORS (ELECTRONIC); PROTECTION; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; THRESHOLD VOLTAGE;

ELECTROSTATIC DISCHARGE PROTECTION; HIGH SPEED CIRCUIT; RADIOFREQUENCY INTEGRATED CIRCUIT; RING OSCILLATOR;

INTEGRATED CIRCUIT LAYOUT;

EID: 0033718338     PISSN: 15292517     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)