Performance limiting factors as RF MOSFETs scaling down

Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium

Volumn , Issue , 2000, Pages 151-154

  Wu, Y H ^a   Chin, Albert ^a   Liang, C S ^a   Wu, C C ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CAPACITANCE; COMPUTER SIMULATION; ELECTRIC RESISTANCE; GATES (TRANSISTOR); INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; PERFORMANCE; SCATTERING PARAMETERS; SEMICONDUCTING SILICON;

NONQUASISTATIC EFFECT; RADIOFREQUENCY INTEGRATED CIRCUIT;

MOSFET DEVICES;

EID: 0033718337     PISSN: 15292517     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)