Effect of deep traps on photo-generated carrier dynamics in high-resistivity CdTe

Journal of Crystal Growth

Volumn 214, Issue , 2000, Pages 212-215

  Ghislotti, Giorgio ^a   Pietralunga, Silvia M ^a   Ripamonti, Luca ^a  

^a CORECOM ^*  (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TRAPS; ENERGY GAP; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; PHOTOCURRENTS; PHOTONS;

DRIFT DIFFUSION MODELS; ELECTROOPTIC MEASUREMENT; INTRAGAP TRAPPING LEVELS; PHOTOGENERATED CARRIER DYNAMICS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0033717967     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00347-X     Document Type: Article

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