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Volumn , Issue , 2000, Pages 330-334

Capturing input switching dependency in crosstalk noise modeling

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; CROSSTALK; ELECTRIC RESISTANCE;

EID: 0033716895     PISSN: 10630988     EISSN: None     Source Type: Journal    
DOI: 10.1109/ASIC.2000.880759     Document Type: Article
Times cited : (3)

References (6)
  • 1
    • 0031354479 scopus 로고    scopus 로고
    • Analytic models for crosstalk delay and pulse analysis under non-ideal inputs
    • W. Chen S. K. Gupta M. A. Breuer Analytic models for crosstalk delay and pulse analysis under non-ideal inputs IEEE ITC'1997 809 818 IEEE ITC'1997
    • Chen, W.1    Gupta, S.K.2    Breuer, M.A.3
  • 2
    • 0031336414 scopus 로고    scopus 로고
    • Efficient coupled noise estimation for on-chip interconnects
    • A. Devgan Efficient coupled noise estimation for on-chip interconnects Proc. ICCAD 147 153 Proc. ICCAD 1997
    • (1997) , pp. 147-153
    • Devgan, A.1
  • 3
    • 85177140795 scopus 로고    scopus 로고
    • Noise and delay uncertainty studies for coupled RC interconnects
    • A. B. Kahng S. Muddu D. Vidhani Noise and delay uncertainty studies for coupled RC interconnects IEEE ASIC conference IEEE ASIC conference 1999-Sept.
    • (1999)
    • Kahng, A.B.1    Muddu, S.2    Vidhani, D.3
  • 4
    • 0028392572 scopus 로고
    • An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
    • A. Rubio N. Itazaki X. Xu K. Kinoshita An approach to the analysis and detection of crosstalk faults in digital VLSI circuits IEEE Transactions on CAD of ICAS 13 3 387 395 March 1994
    • (1994) IEEE Transactions on CAD of ICAS , vol.13 , Issue.3 , pp. 387-395
    • Rubio, A.1    Itazaki, N.2    Xu, X.3    Kinoshita, K.4
  • 5
    • 0032681122 scopus 로고    scopus 로고
    • Harmony: static noise analysis of deep submicron digital integrated circuits
    • K. L. Shepard V. Narayanan R. Rose Harmony: static noise analysis of deep submicron digital integrated circuits IEEE Transactions on CAD of ICAS 18 8 1132 1150 Aug. 1999
    • (1999) IEEE Transactions on CAD of ICAS , vol.18 , Issue.8 , pp. 1132-1150
    • Shepard, K.L.1    Narayanan, V.2    Rose, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.