Growth and surface analysis of BaTiO3 ultrathin film fabricated by laser molecular beam epitaxy

Microelectronic Engineering

Volumn 51, Issue , 2000, Pages 601-604

  Cui, D F ^a   Chen, Z H ^a   Zhao, T ^a   Chen, F ^a   Lu, H B ^a   Zhou, Y L ^a   Yang, G Z ^a   Huang, H Z ^b   Zhang, H X ^b  

^a INSTITUTE OF PHYSICS   (China)

^b Peking University   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; HIGH ENERGY ELECTRON DIFFRACTION; LASER APPLICATIONS; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR GROWTH; STRONTIUM COMPOUNDS; SURFACE ROUGHNESS; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY; BARIUM TITANATE ULTRATHIN FILM; LASER MOLECULAR BEAM EPITAXY; TERMINATED SURFACE;

BARIUM TITANATE;

EID: 0033716575     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(99)00523-7     Document Type: Article

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