Direct measurement of Vth fluctuation caused by impurity positioning

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2000, Pages 136-137

  Tanaka, Takuji ^a   Usuki, Tatsuya ^a   Momiyama, Youichi ^a   Sugii, Toshihiro ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IMPURITIES; RANDOM ACCESS STORAGE; STATISTICS;

IMPURITY POSITIONING; SYNTHETIC RANDOM ACCESS MEMORY (SRAM);

MOSFET DEVICES;

EID: 0033716163     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)